The effect of surface roughness on XPS and AES
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference13 articles.
1. Characterization of Solid Surfaces;Chang,1974
2. Instrumentation for surface studies: XPS angular distributions
3. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
4. Concentration profiles for irregular surfaces from x-ray photoelectron angular distributions
Cited by 37 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses;Nanoscale;2020
2. Work function investigations of Al-doped ZnO for band-alignment in electronic and optoelectronic applications;Applied Surface Science;2019-08
3. 3-Dimensionally ordered macroporous PEDOT ion-exchange resins prepared by vapor phase polymerization for triggered drug delivery: Fabrication and characterization;Electrochimica Acta;2018-04
4. Soil wettability can be explained by the chemical composition of particle interfaces - An XPS study;Scientific Reports;2017-02-17
5. Nanostructuring and oxidation of diamond by two-photon ultraviolet surface excitation: An XPS and NEXAFS study;Physical Review B;2014-05-15
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3