Thin film surface studies by X-ray reflection
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference42 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Density Measurements of Some Thin Copper Films
3. A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference Fringes
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