Evidence of SiO at the Si-oxide interface by surface soft X-ray absorption near edge spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference29 articles.
1. Chemical bond and related properties of SiO2 I. character of the chemical bond
2. Chemical bond and related properties of SiO2 III. Core-level shifts in SiOx
3. Effect of heat treatment on chemical and electronic structure of solid SiO : An electron spectroscopy study
4. Photoemission studies of the surface states and oxidation of group IV semiconductors
5. An analysis of the radial distribution function of SIOx
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