Sampling depths in total yield and reflectivity SEXAFS studies in the soft X-ray region
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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1. Possibility of adsorbate position determination using final-state interference effects
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4. EXAFS and surface‐EXAFS studies in the soft x‐ray region using electron yield spectroscopy
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