Energy- and angle-resolved detection of neutral atoms desorbed from ion bombarded single crystals. Rh{111} and p(2 × 2)O/Rh{111}-Reference-Cited by-同舟云学术

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Energy- and angle-resolved detection of neutral atoms desorbed from ion bombarded single crystals. Rh{111} and p(2 × 2)O/Rh{111}

Published:1986-10 Issue:1-2 Volume:176 Page:L817-L824
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Winograd N.,Kobrin P.H.,Schick G.A.,Singh J.,Baxter J.P.,Garrison B.J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference19 articles.

1. Ion Implantation in Semiconductors;Mayer,1970

2. CF4/silicon surface reactions: Evidence for parallel etching mechanisms from modulated ion beam studies

3. Characterization of solids and surfaces using ion beams and mass spectrometry

4. Computer Simulation of Pit Formation in Metals by Ion Bombardment

5. Controlled Sputtering of Metals by Low-Energy Hg Ions

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1. Angular distribution of sputtered particles from Inconel⁷¹⁸: a simulation study;The European Physical Journal Applied Physics;2023

2. Preferential ejection of sputtered and reflected atoms in the keV bombardment of Cu(110) with noble gas ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-09

3. Atomic placement of Al on the GaAs {001}c(4×4)reconstruction determined by angle-resolved secondary-ion mass spectrometry;Physical Review B;1999-04-15

4. Molecular and dissociative chemisorption of NO on palladium and rhodium (100) and (111) surfaces: A density-functional periodic study;The Journal of Chemical Physics;1998-04-15

5. LEED crystallographic analysis for the Rh(111)-(2 × 1)O surface structure;Surface Science;1996-07

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