A STM study of the effects of the ion incident angle and energy on surface damage induced by Ar+ bombardment of HOPG-Reference-Cited by-同舟云学术

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A STM study of the effects of the ion incident angle and energy on surface damage induced by Ar+ bombardment of HOPG

Published:1994-06 Issue:3 Volume:312 Page:399-410
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Li T.,King B.V.,MacDonald R.J.,Cotterill G.F.,O'Connor D.J.,Yang Q.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference33 articles.

1. Surface radiation damage

2. Surface Studies by Scanning Tunneling Microscopy

3. 7 × 7 Reconstruction on Si(111) Resolved in Real Space

4. Atomic Force Microscope

5. Point defect formation on graphite surface induced by ion impact at energies near penetration threshold

Cited by 57 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The surface defects of HOPG induced by low-energy Ar+ ion irradiation;Applied Surface Science;2022-05

2. SEY and low-energy SEY of conductive surfaces;Journal of Electron Spectroscopy and Related Phenomena;2020-05

3. The effect of structural disorder on the secondary electron emission of graphite;AIP Advances;2016-09

4. CARBON ION IRRADIATION EFFECTS ON PULSED LASER DEPOSITED TITANIUM NITRIDE THIN FILMS;Surface Review and Letters;2015-04

5. Development of edge state on graphite surface induced by Ar+ irradiation studied using near-edge X-ray absorption fine structure spectroscopy;Carbon;2014-06

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