Field effect measurement on pure and CO covered ultra-thin nickel films-Reference-Cited by-同舟云学术

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Field effect measurement on pure and CO covered ultra-thin nickel films

Published:1979-07 Issue: Volume:86 Page:83-91
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Finzel H.-U.,Wissmann P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference26 articles.

1. Electrical Conduction Mechanism in Ultrathin, Evaporated Metal Films

2. Electrical Conduction in Thin Metal Filims;Coutts,1974

3. Electrical conduction in discontinuous metal films: A discussion

4. Electrical Properties of Semiconductor Surfaces;Frankl,1967

5. Semiconductor Surfaces;Many,1971

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2. The Electrical Resistivity of Ultra-Thin Copper Films;Zeitschrift für Naturforschung A;2008-11-01

3. Chapter 2: Resistivity Measurements on Pure and Gas Covered Silver Films;Studies in Surface Science and Catalysis;1987

4. The metallic field effect in thin polycrystalline films;Thin Solid Films;1986-01

5. The d−3 Law Describing the Thickness Dependence of the Electrical Resistivity of Rough Metal Films;Annalen der Physik;1986

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