(Ca, Sr)F2 surface roughness effect on angle resolved XPS measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference30 articles.
1. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
2. Angle-resolved x-ray photoelectron spectroscopy
3. Properties of oxidized silicon as determined by angular-dependent X-ray photoelectron spectroscopy
4. Atom profiles of interfaces with polar-angle-dependent photoemission: Au/GaAs(100)
5. In-Depth Profiling of Suboxide Compositions in the SiO2/Si Interface by Angle-Resolved X-Ray Photoelectron Spectroscopy
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