Directional Auger electron spectroscopy (DAES) and directional elastic peak electron spectroscopy (DEPES) in the investigation of the crystalline structure of surface layers: the Ag/Cu(111) interface
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference8 articles.
1. X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography
2. Epitaxial film crystallography by high-energy Auger and X-ray photoelectron diffraction
3. The influence of diffraction effects on quantitative Auger electron spectroscopy
4. Incident-beam enhancements of Auger electron scattering
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