Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
41 articles.
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1. Comments on “Sputtering of dimers off a silicon surface” by M.I. Nietiadi et al.;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-05
2. Bulk-compositional changes of Ni2Al3 and NiAl3 during ion etching;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-04
3. On the formation of concentration profiles by low-energy ion bombardment and sputter depth profiling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-09
4. Concentration microprofiles in iron silicides induced by low energy Ar+ ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-06
5. Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment;Fresenius' Journal of Analytical Chemistry;1997-05-21