Ellipsometric liquid immersion method for the determination of all the optical parameters of the system: Nonabsorbing film on an absorbing substrate
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference11 articles.
1. Determination of the Properties of Films on Silicon by the Method of Ellipsometry
2. Ellipsometry in the Measurement of Surfaces and Thin Films;Archer,1964
3. Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*
4. Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate Optical Constants of Silicon*
5. Thin oxide films on germanium
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