Optical constants of Bi8Te7S5-Reference-Cited by-同舟云学术

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Optical constants of Bi8Te7S5

Published:1969-08 Issue: Volume:16 Page:365-369
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Malm William C.,Liu Andrew J.D.,Soonpaa Henn H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference2 articles.

1. Size effect semimetal to semiconductor transition

2. Basic Problems in Thin Film Physics;Soonpaa,1966

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of the Shamir-Gräff method for measuring optical constants of thin films;Applied Optics;1979-10-15

2. Ellipsometric Techniques to Study Surfaces and Thin Films;Advances in Electronics and Electron Physics;1979

3. Optical constants of bismuth tellurium sulfide from ellipsometric data*;Journal of the Optical Society of America;1974-12-01

4. V-VI Compounds;Semiconductors;1972

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