Are EELS and TCS methods complementary?
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference18 articles.
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Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A proposal for an electron energy spectrometer based on two simulated hemispherical analysers in tandem for TCS, EELS and SEE;Vacuum;1994-02
2. Surface spectroscopy from ultrathin α-Sn films on CdTe(110);Surface Science;1993-05
3. Correlations of TCS and EELS spectral features for graphite, ZnSe(111) and CdTe(110);Surface Science;1989-04
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