Relationship between densification behavior and stabilization of quasi-liquid grain boundary layers in CuO-doped 0.7CaTiO3–0.3NdAlO3 microwave ceramics-Reference-Cited by-同舟云学术

Relationship between densification behavior and stabilization of quasi-liquid grain boundary layers in CuO-doped 0.7CaTiO3–0.3NdAlO3 microwave ceramics

Published:2016-01 Issue: Volume:111 Page:102-105
ISSN:1359-6462
Container-title:Scripta Materialia
language:en
Short-container-title:Scripta Materialia

Author:

Cheng Lijin,Liu Liang,Ma Qing,Liu Shaojun

Funder

Natural Science Foundation of China

Shenzhen Fundamental Science Research Foundation

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,Mechanics of Materials,Metals and Alloys,Mechanical Engineering

Reference30 articles.

1. Growth and characterization of epitaxial Ba(Zn1/3Ta2/3)O3 (100) thin films

2. High-Permittivity Temperature-Stable Ceramic Dielectrics with Low Microwave Loss

3. Characterization of CaTiO3-NdAlO3 dielectric ceramics

4. Microwave dielectric properties of ceramics based on CaTiO3–LnMO3 System (Ln–La, Nd; M–Al, Ga)

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