Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography-Reference-Cited by-同舟云学术

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Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography

Published:2018-04 Issue: Volume:148 Page:106-114
ISSN:1359-6462
Container-title:Scripta Materialia
language:en
Short-container-title:Scripta Materialia

Author:

Cojocaru-Mirédin Oana,Schwarz Torsten,Abou-Ras Daniel

Funder

Federal Ministry of Education and Research

Helmholtz Virtual Institute

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,Mechanics of Materials,Metals and Alloys,Mechanical Engineering

Reference40 articles.

1. Symmetry dependent optoelectronic properties of grain boundaries in polycrystalline Cu(In,Ga)Se2 thin films

2. Industry & Suppliers;Roselund,2016

3. Direct Insight into Grain Boundary Reconstruction in PolycrystallineCu(In,Ga)Se2with Atomic Resolution

4. Electron Backscatter Diffraction in Materials Science;Adam,2009

5. A critical review of orientation microscopy in SEM and TEM

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