An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,Mechanics of Materials,Metals and Alloys,Mechanical Engineering
Reference20 articles.
1. Transmission electron microscopy of the amorphization of copper indium diselenide by in situ ion irradiation
2. Amorphization of crystalline Si due to heavy and light ion irradiation
3. Models and mechanisms of irradiation-induced amorphization in ceramics
4. Relation of neutron to ion damage annealing in Si and Ge
5. Damaged regions in neutron-irradiated and ion-bombarded Ge and Si
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