Ballistic electron emission microscopy of metal/semiconductor interfaces and heterojunctions
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference15 articles.
1. Metal-Semiconductor Contacts;Rhoderick,1988
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3. Schottky-Barrier Formation at Single-Crystal Metal-Semiconductor Interfaces
4. Atomic-structure-dependent Schottky barrier at epitaxial Pb/Si(111) interfaces
5. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
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1. Well-Patterned Metal-Semiconductor Interface Improving Contact Conductance;Journal of Nanoscience and Nanotechnology;2012-10-01
2. BEEM imaging and spectroscopy of buried structures in semiconductors;Physics Reports;2001-08
3. THE ROLE OF BALLISTIC ELECTRON EMISSION MICROSCOPY FOR CHARACTERIZATION OF PHYSICAL PHENOMENA IN SEMICONDUCTOR ALLOYS AND QUANTUM STRUCTURES;International Journal of High Speed Electronics and Systems;2000-03
4. Interface applications of scanning near-field optical microscopy with a free electron laser;PHYS STATUS SOLIDI A;1999
5. Interface Applications of Scanning Near-Field Optical Microscopy with a Free Electron Laser;physica status solidi (a);1999-09
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