Determination of the growth mechanism of overlayers on solid surfaces: a method based on combined XPS and LEIS measurements
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
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1. Double matrix effect in Low Energy Ion Scattering from La surfaces;Applied Surface Science;2018-05
2. In Situ Characterizations of Nanostructured SnOx/Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM);The Journal of Physical Chemistry C;2014-01-22
3. Cobalt electrodeposition on polycrystalline palladium. Influence of temperature on kinetic parameters;Journal of Solid State Electrochemistry;2012-03-25
4. CO oxidation on nanostructured SnOx/Pt(111) surfaces: unique properties of reduced SnOx;Physical Chemistry Chemical Physics;2012
5. UHV-EC Characterization of Ultrathin Films Electrodeposited on Well-Defined Noble Metals. II: Co on Pd(111);Electrocatalysis;2010-03-17
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