The relation between Auger signal-to-background ratios and atomic concentration-Reference-Cited by-同舟云学术

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The relation between Auger signal-to-background ratios and atomic concentration

Published:1985-08 Issue:2 Volume:24 Page:147-156
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

El Gomati M.M.,Matthew J.A.D.,Prutton M.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference16 articles.

1. Proc. Conf. on Electron Specimen Interaction;Bishop,1982

2. Scanning Electron Microscopy/1983;Bishop,1983

3. Scanning Electron Microscopy/1983;Seah,1983

4. A ratio technique for micro-Auger analysis

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