Comparison of AES chemical shifts with XPS chemical shifts
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference6 articles.
1. Practical Surface Analysis;Wagner,1990
2. NIST X-ray Photoelectron Spectroscopy Database, National Institute of Standards and Technology (Gaithersburg, MD 20899, USA).
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