Lateral and depth scale calibration of the position sensitive atom probe-Reference-Cited by-同舟云学术

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Lateral and depth scale calibration of the position sensitive atom probe

Published:1994-03 Issue: Volume:76-77 Page:382-391
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hyde J.M.,Cerezo A.,Setna R.P.,Warren P.J.,Smith G.D.W.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference9 articles.

1. Materials analysis with a position-sensitive atom probe

2. Site occupation determinations by APFIM for Hf, Fe, and Co in Ni3Al

3. Field Emission and Field Ionization;Gomer,1961

4. Atom-Probe Microanalysis: Principles and Applications in Materials Science;Miller,1989

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