Biased referencing experiments for the XPS analysis of non-conducting materials-Reference-Cited by-同舟云学术

Biased referencing experiments for the XPS analysis of non-conducting materials

Published:1986-08 Issue:2 Volume:26 Page:129-149
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Edgell M.J.,Baer D.R.,Castle J.E.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference19 articles.

1. ESCA: Atomic, Molecular and Solid-State Structures Studied by Means of Electron Spectroscopy;Siegbahn,1967

2. Use of an Electron Flood Gun to Reduce Surface Charging in X‐Ray Photoelectron Spectroscopy

3. M.J. Edgell, R.W. Paynter and J.E. Castle, The Use of an Electron Flood Gun when adopting Monochromated AgLα Radiation for the XPS Analysis of Insulators [Surface Interface Anal., accepted].

4. Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy;Barr,1983

5. Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy;Swift,1983

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