Experimental investigation of hotspot phenomenon in PV arrays under mismatch conditions
Author:
Publisher
Elsevier BV
Subject
General Materials Science,Renewable Energy, Sustainability and the Environment
Reference45 articles.
1. Amerasekera. A. Chang, M. Saatchi, J. Chatterjee, A. Mayaram, K. Chern, J.H. 1993. Self heating effects in basic semiconductor structures. IEEE Trans. Electron. Devices 40, 1836–1844.
2. Characteristic output of PV systems under partial shading or mismatch conditions;Bai;Sol. Energy,2015
3. Hot spots in multicrystalline silicon solar cells: avalanche breakdown due to etch pits;Bauer;Phys. Status Solidi Rapid Res. Lett.,2009
4. Modeling, analysis and comparison of solar photovoltaic array configurations under partial shading conditions;Belhachat;Sol. Energy,2015
5. Analysis and comparison of different PV array configurations under partial shading conditions;Bingol;Sol. Energy,2018
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