Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy-Reference-Cited by-同舟云学术

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Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy

Published:2018-03 Issue: Volume:162 Page:330-335
ISSN:0038-092X
Container-title:Solar Energy
language:en
Short-container-title:Solar Energy

Author:

Jiang C.-S.,Xiao C.,Moutinho H.R.,Johnston S.,Al-Jassim M.M.,Yang X.,Chen Y.,Ye J.

Funder

U.S. Department of Energy

National High-tech Research and Development Program

Publisher

Elsevier BV

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment

Reference12 articles.

1. Recovery after potential-induced degradation of CIGS solar cells with CdS and Zn(O, S) buffer layers;Fjallstrom;IEEE J. Photovolt.,2015

2. Hacke,P., Terwilliger,K., Smith,R., Glick,S., Pankow, J., Kempe,M., Kurts,S., Bennett,I., Kloos, M., 2011. System voltage potential-induced degradation mechanisms in PV modules and methods for test. In: Proc. 37th IEEE-PVSC, 19–24 June 2011, http://doi.org/10.1109/PVSC.2011.6186079.

3. Scanning capacitance spectroscopy on n+-p asymmetrical junction in multicrystalline Si solar cells;Jiang;J. Appl. Phys.,2011

4. Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells;Naumann;Sol. Energy Mater. Sol. Cells,2014

5. Naumann,V., Breitenstein,O., Bauer,J., Hagendorf,C. 2017. Search for microstructural defects as nuclei for PID-shunts in silicon solar cells. In: Proc. 44th IEEE-PVSC, 25–30 June 2017, Washington DC, USA, in press.

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1. Numerical simulations of potential-induced degradation;Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics;2022

2. Temporal-spatial-energy resolved advance multidimensional techniques to probe photovoltaic materials from atomistic viewpoint for next-generation energy solutions;Energy & Environmental Science;2021

3. Local Resistance Measurement for Degradation of c-Si Heterojunction with Intrinsic Thin Layer (HIT) Solar Modules;2020 47th IEEE Photovoltaic Specialists Conference (PVSC);2020-06-14

4. Numerical simulation of potential induced degradation (PID) in different thin-film solar cells using SCAPS-1D;Solar Energy;2019-08

5. Electrically-functionalised nanoindenter dedicated to local capacitive measurements: Experimental set-up and data-processing procedure for quantitative analysis;Sensors and Actuators A: Physical;2019-08

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