Ballistic-electron emission microscopy (BEEM): studies of metal/semiconductor interfaces with nanometer resolution-Reference-Cited by-同舟云学术

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Ballistic-electron emission microscopy (BEEM): studies of metal/semiconductor interfaces with nanometer resolution

Published:1995-03 Issue:4 Volume:253 Page:163-233
ISSN:0370-1573
Container-title:Physics Reports
language:en
Short-container-title:Physics Reports

Author:

Prietsch Mario

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference116 articles.

1. Physics of Semiconductor Devices;Sze,1981

2. Semiconductor Devices: Physics and Technology;Sze,1984

3. Metal-Semiconductor Contacts;Rhoderick,1988

4. The structure and properties of metal-semiconductor interfaces

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