Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films-Reference-Cited by-同舟云学术

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Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films

Published:2004-01 Issue:1 Volume:321 Page:67-73
ISSN:0375-9601
Container-title:Physics Letters A
language:en
Short-container-title:Physics Letters A

Author:

Li Li-Ben,Zhang Jian,Yin Zhen,Zhang Ming-Sheng

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference29 articles.

1. Ferroelectric Memories;Scott,2002

2. Ferroelectric Phenomena in Crystals;Strukov,1998

3. Film Thickness Dependence of Dielectric Properties ofBaTiO3Thin Films Prepared by Sol-Gel Method

4. Microstructure and dielectric parameters of epitaxial SrRuO3/BaTiO3/SrRuO3 heterostructures

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1. Effect of electromechanical boundary conditions on the properties of epitaxial ferroelectric thin films;Chinese Physics B;2011-10

2. Extrinsic Scaling Effects on the Dielectric Response of Grained BaTiO₃ Films;Key Engineering Materials;2010-03

3. Thermodynamic analysis of stress effect on Bi4Ti3O12 films;Journal of Applied Physics;2008-02

4. Gradient-stress on polarization in Ba1−x Sr x TiO3 films;Frontiers of Physics in China;2007-07

5. Paraelectric thin films by nanoscale engineering of epitaxy and planar anisotropy for microwave phase shifter applications;IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control;2006-12

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