Measurement of the frequency dependence of the ultrasonic reflection coefficient from thin interface layers and partially contacting interfaces-Reference-Cited by-同舟云学术

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Measurement of the frequency dependence of the ultrasonic reflection coefficient from thin interface layers and partially contacting interfaces

Published:1997-11 Issue:7 Volume:35 Page:479-488
ISSN:0041-624X
Container-title:Ultrasonics
language:en
Short-container-title:Ultrasonics

Author:

Drinkwater Bruce,Cawley Peter

Publisher

Elsevier BV

Subject

Acoustics and Ultrasonics

Reference15 articles.

1. Ultrasonic classification of imperfect interfaces;Nagy;J NDE,1992

2. Ultrasonic scattering from imperfect interfaces: a quasi-static model;Baik;J NDE,1984

3. Ultrasonic reflectivity of diffusion bonds;Rose,1989

4. The detection of thin embedded layers using normal incidence ultrasound;Pialucha;Ultrasonics,1994

5. The practical application of solid coupled ultrasonic transducers;Drinkwater;Materials Evaluation,1996

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