Implementation of a failure model validation technique using a discrete-event batch simulator : Application to semiconductor manufacturing-Reference-Cited by-同舟云学术

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Implementation of a failure model validation technique using a discrete-event batch simulator : Application to semiconductor manufacturing

Published:2001 Issue: Volume: Page:117-122
ISSN:1570-7946
Container-title:Computer Aided Chemical Engineering
language:
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Author:

Charles A.S.,Azzaro-Pantel C.,Domenech S.,Pibouleau L.,Floquet P.,Jaume D.,Tilhac F.

Publisher

Elsevier

Reference7 articles.

1. 17th IASTED Int.;Navarre,1998

2. Some pitfalls in reliability data analysis

3. Fondements de la décision de la maintenance;Pellegrin,1997

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimization of preventive maintenance strategies in a multipurpose batch plant: application to semiconductor manufacturing;Computers & Chemical Engineering;2003-04

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