Photo-induced recombination in minority-carrier dominated germanium: Case study of limitation on photo-induced open-circuit voltage decay method
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference18 articles.
1. A generalised approach to lifetime measurement in pn junction solar cells
2. Recombination in germanium: Voltage-decay experiments on induced-junction devices and validity of the SRH model
3. Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay
4. Theory of photo induced open circuit voltage decay in a solar cell
5. Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cells
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