Variations in the electrical short-circuit current decay for recombination lifetime and velocity measurements
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference8 articles.
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2. Transistors and Active Circuits;Linvill,1961
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1. Determination of polysilicon solar cell parameters using electrical short-circuit current decay method;Solid-State Electronics;1998-04
2. Solar cells: New transient voltage method for lifetime and recombination determination in concentrated solar irradiance;Renewable Energy;1994-08
3. Régimes transitoires des photopiles : durée de vie des porteurs et vitesse de recombinaison;Journal de Physique III;1992-12
4. A NEW TRANSIENT VOLTAGE METHOD APPLIED TO LIFETIME AND SURFACE RECOMBINATION DETERMINATION;1991 Solar World Congress;1992
5. Determination of lifetime and surface recombination velocity in solar cells;Solar Cells;1991-06
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