1. Ion migration failure in integrated circuits;Cerofolini;Thin Solid Films,1972
2. Silicon surface passivation for devices;Yon;NASA NGR 36-003-067,1971
3. A technique for determining life capability of individual semiconductors;Walsh,1969
4. Effects of low temperature on reverse I-V characteristics of silicon diodes;Cocca,1969
5. Study of noise in semiconductor devices to noise in PIN diodes;Vanderziel;NTIS AD 821 498,1967