Measurement techniques in thin film polycrystalline materials and devices (solar cells)-Reference-Cited by-同舟云学术

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Measurement techniques in thin film polycrystalline materials and devices (solar cells)

Published:1980-05 Issue:3 Volume:1 Page:327-346
ISSN:0379-6787
Container-title:Solar Cells
language:en
Short-container-title:Solar Cells

Author:

Charles Harry K.,King Richard J.,Ariotedjo Arie P.

Publisher

Elsevier BV

Subject

General Engineering

Reference59 articles.

1. Electrical characterization of polycrystalline silicon;McKelvey,1976

2. Dendritic Crystallization;Saratovkin,1959

3. Contributions of materials technology to semiconductor devices;Petritz,1962

4. Casting large silicon crystals in clear silica crucibles;Khattak;Ceram. Bull.,1978

5. Ribbon-to-ribbon growth;Baghadadi,1976

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hole‐diffusion length and transport parameters of thin CdS films from a Schottky barrier;Journal of Applied Physics;1986-03-15

2. Photovoltaic Measurements, Junction Analysis, and Material Characterization;Thin Film Solar Cells;1983

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