1. The construction of optimal deterministic partitionings in scan-based BIST fault diagnosis: Mathematical foundations and cost-effective implementations;Bayraktaroglu;IEEE Trans. Comput.,2005
2. Essentials of Electronic Testing;Bushnell,2000
3. Gate level fault diagnosis in scan-based BIST;Bayraktaroglu;DATE,2002
4. A.B. Khang, S. Reda, Combinatorial group testing methods for the BIST diagnosis problem, Design Automation Conf., Proceedings of the ASP-DAC, Asia and South Pacific, vol. 27–30, 2004, pp. 113–116.
5. An interval-based diagnosis scheme for identifying failing vectors in a scan-BIST environment;Liu;DATE,2002