Reliable data path design of VLIW processor cores with comprehensive error-coverage assessment-Reference-Cited by-同舟云学术

Reliable data path design of VLIW processor cores with comprehensive error-coverage assessment

Published:2010-02 Issue:1 Volume:34 Page:49-61
ISSN:0141-9331
Container-title:Microprocessors and Microsystems
language:en
Short-container-title:Microprocessors and Microsystems

Author:

Chen Yung-Yuan,Leu Kuen-Long

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software

Reference31 articles.

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4. J.B. Nickle, A.K. Somani, REESE: a method of soft error detection in microprocessors, in: DSN’01, 2001, pp. 401–410.

5. D.M. Blough, A. Nicolau, Fault tolerance in super-scalar and vliw processors, in: IEEE Workshop on Fault Tolerant Parallel and Distributed Systems, 1992, pp. 193–200.

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