Lock-in thermography based local solar cell analysis for high efficiency monocrystalline hetero junction type solar cells
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. The role of inhomogeneities for understanding current-voltage characteristics of solar cells;Breitenstein;IEEE J. Photovolt.,2018
2. Explanation of commonly observed shunt currents in c-Si solar cells by means of recombination statistics beyond the Shockley-Read-Hall approximation;Steingrube;J. Appl. Phys.,2011
3. See 〈www.maxplanckinnovation.de/en〉.
4. Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials;Breitenstein,2010
5. Nondestructive local analysis of current-voltage characteristics of solar cells by lock-in thermography;Breitenstein;Sol. Energy Mater. Sol. Cells,2011
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