Defect detection in metals using electronic speckle pattern interferometry-Reference-Cited by-同舟云学术

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Defect detection in metals using electronic speckle pattern interferometry

Published:2005-07 Issue:2 Volume:88 Page:217-225
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Andrés Zarate Esteban,Custodio G Edén,Treviño-Palacios Carlos G.,Rodríguez-Vera Ramón,Puga-Soberanes Hector J.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. T. L. Charles, R. Summitt, A. Sleker, in: Handbook of Materials Science, vol. 1, CRC Press Inc, Boca Raton, 1983.

2. Surfase contourning using ESPI;David;Proc. SPIE,1991

3. Speckle Metrology;Sirohi Rapjal,1993

4. General parameters for the design and optimization of ESPI;Jones;Opt. Acta,1981

5. Whole-field strain measurement in a pin-loaded plate by ESPI in the finite element method;Lanza di scalea;Experimental Mechanics,1997

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