Dislocation-related deep levels in carbon rich p-type polycrystalline silicon
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. Electronic behaviour of decorated stacking faults in silicon
2. Effect of oxygen aggregation processes on the recombining activity of 60° dislocations in Czochralski grown silicon
3. Defect states inp‐type silicon crystals induced by plastic deformation
4. Capture kinetics at deep-level defects in lattice-mismatched GaAs-based heterostructures
Cited by 44 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Rational Design of A‐Site Cation for High Performance Lead‐Free Perovskite X‐Ray Detectors;Small;2024-09-02
2. Van der Waals epitaxial AlGaN/GaN growth on hexagonal BN via two-dimensional N-induced dislocation slip;Scripta Materialia;2024-07
3. Highly Crystalized MAPbX3 Perovskite Triangular Nanowire Arrays for Optoelectronic Applications;Advanced Materials;2023-12-06
4. Dion–Jacobson Phase Perovskite Crystal Assembled by π‐Conjugated Aromatic Spacer for X‐Ray Detectors with an Ultralow Detection Limit;Advanced Functional Materials;2023-11-14
5. Lone‐pair Electrons Enhancement Effect: SnTe3O8 Hard X‐ray Detection with Stable High‐temperature Sensitivity and Ultralow Detection Limit;Advanced Functional Materials;2023-03-28
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3