Correlation between the open-circuit voltage and recombination loss at metal-silicon interfaces of crystalline silicon solar cells

Author:

Jeong Myeong Sang,Min Kwan Hong,Choi Sungjin,Kang Min Gu,Jeong Kyung Taek,Lee Eun Tae,Kang Yoonmook,Kim Donghwan,Lee Hae-Seok,Song Hee-eun,Park Sungeun

Funder

Research and Development of the Korea Institute of Energy Research

Korea Institute of Energy Technology Evaluation and Planning

Ministry of Knowledge Economy, Korea

National Research Foundation

Ministry of Science, ICT & Future Planning

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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3. New measurement method for the investigation of space charge region recombination losses induced by the metallization of silicon solar cells;Hoenig;Energy Procedia,2011

4. Recombination at laser-processed local base contacts by dynamic infrared lifetime mapping;Müller;J. Appl. Phys.,2010

5. Comparison of emitter saturation current densities determined by injection-dependent lifetime spectroscopy in high and low injection regimes;Reichel;Prog. Photovoltaics Res. Appl.,2012

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