Depth profiling of Cu(In,Ga)Se2 thin films grown at low temperatures-Reference-Cited by-同舟云学术

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Depth profiling of Cu(In,Ga)Se2 thin films grown at low temperatures

Published:2009-06 Issue:6-7 Volume:93 Page:859-863
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Kaufmann C.A.,Caballero R.,Unold T.,Hesse R.,Klenk R.,Schorr S.,Nichterwitz M.,Schock H.-W.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Cited by 77 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. UV femtosecond single-pulse and collinear double-pulse laser-induced breakdown spectroscopy (LIBS) for depth-resolved characterization of nano-scaled films;Applied Surface Science;2023-12

2. Sulfur-Treated ITO Back Contact for Enhanced Performance of Semitransparent Ultrathin Cu(In,Ga)Se₂ Solar Cells;ACS Applied Energy Materials;2022-08-17

3. The effect of annealing temperature on Cu2ZnGeSe4 thin films and solar cells grown on transparent substrates;Journal of Physics: Materials;2021-05-07

4. Structural characterization of polycrystalline thin films by X-ray diffraction techniques;Journal of Materials Science: Materials in Electronics;2021-01

5. Chalcopyrite Thin-Film Materials and Solar Cells;Reference Module in Earth Systems and Environmental Sciences;2021

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