1. A wafer-based monocrystalline silicon photovoltaics road map: utilizing known technology improvement opportunities for further reductions in manufacturing costs;Goodrich;Sol. Energy Mater. Sol. Cells,2013
2. S. Krauter, Identification and elimination of potential induced degradation (PID) at photovoltaic power plants, In: Proceedings of the 6th WCPEC, Joint Conference of the 24th International PVSEC-24, 41st IEEE Photovoltaic Specialists Conference, the 30th EU PVSEC, Kyoto, Japan, 2014.
3. 〈http://www.pv-magazine.com/archive/articles/beitrag/no-confidence-in-manufacturer-tests-_100012909/572/#axzz3l34bLnby〉 (last accessed 03.10.15).
4. IEC 61215, Crystalline Silicon Terrestrial Photovoltaic Modules – Design Qualification and Type Approval, edition 2, 2005.
5. Analysis of leakage currents in photovoltaic modules under high voltage bias in the field;del Cueto;Prog. Photovolt. Res. Appl.,2002