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On the application of energy filtering TEM in materials science: I. Precipitates in a Ni/Cr-alloy

  • Published:1995-01 Issue:5 Volume:26 Page:377-390
  • ISSN:0968-4328
  • Container-title:Micron
  • language:en
  • Short-container-title:Micron

Author:

Hofer Ferdinand,Warbichler Peter,Grogger Werner,Lang Oliver

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference32 articles.

1. Electron spectroscopic imaging: an advanced technique for imaging and analysis in transmission electron microscopy;Bauer,1988

2. Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope;Berger;Optik,1993

3. Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4;Berger;Ultramicroscopy,1994

4. Developments in processing image sequences for elemental mapping;Bonnet,1988

5. Concentration histogram imaging: a quantitative view of related images;Bright;Microscopy: The Key Research Tool,1992

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2. Impact of Dielectric Layers on Liquid-Phase Crystallized Silicon Solar Cells;IEEE Journal of Photovoltaics;2018-01

3. Transmission Electron Microscopy of Nanostructures;Microscopy Methods in Nanomaterials Characterization;2017

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