High resolution non-destructive evaluation of defects using artificial neural networks and wavelets-Reference-Cited by-同舟云学术

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High resolution non-destructive evaluation of defects using artificial neural networks and wavelets

Published:2012-11 Issue: Volume:52 Page:69-75
ISSN:0963-8695
Container-title:NDT & E International
language:en
Short-container-title:NDT & E International

Author:

Farley S.J.,Durodola J.F.,Fellows N.A.,Hernández-Gómez L.H.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science

Reference23 articles.

1. Microelectronic package characterisation using scanning acoustic microscopy;Zhang;NDT&E Int,2007

2. Non-destructive testing;Halmshaw,1991

3. Wavelet-based deconvolution of ultrasonic signals in destructive evaluation;Herrera;J Zhenjian Univ Sci A,2006

4. Classification of weld defects from ultrasonic images. A neural network approach.;Windsor;Br J Non-Destr Test,1993

5. Neural network for pattern recognition;Bishop,1996

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