Pulsed THz imaging for thickness characterization of plastic sheets-Reference-Cited by-同舟云学术

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Pulsed THz imaging for thickness characterization of plastic sheets

Published:2020-12 Issue: Volume:116 Page:102338
ISSN:0963-8695
Container-title:NDT & E International
language:en
Short-container-title:NDT & E International

Author:

Zhai Min,Locquet Alexandre,Citrin D.S.

Funder

Conseil Régional Grand Est and CPER SusChemProc

Publisher

Elsevier BV

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science

Reference48 articles.

1. Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy;Duvillaret;Appl Optic,1999

2. Characterization of structures from X-ray scattering data using genetic algorithms;Wormington;Phil Trans Roy Soc Lond,1999

3. X-ray thin film measurement techniques;Inaba;The Rigaku Journal,2008

4. A simple TEM method for fast thickness characterization of suspended graphene flakes;Akhtar;Microsc Microanal,2016

5. Identification of coating damage processes in corroded galvanized steel by acoustic emission wavelet analysis;Gallego;Surf Coating Technol,2007

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