Tool Dynamics-induced Surface Topography Error in Fast Tool Servo-Based Diamond Turning of Micro Dome Arrays
Author:
Publisher
Elsevier BV
Reference22 articles.
1. John E. Greivenkamp, Daniel G. Smith, Eric Goodwin, "Calibration issues with Shack-Hartmann sensors for metrology applications" Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, 2004.
2. "Laboratory characterization of the ARGOS laser wavefront sensor" Proc;Bonaglia;SPIE 8447, Adaptive Optics Systems III,2012
3. Vijay Ramya Kolli, Fabian Kloiber, Simon Drieschner, "Next generation imprint equipment for patterning high quality micro-optical elements," Proc. SPIE 12497, Novel Patterning Technologies, 2023
4. Reinhard Voelkel, Li Gong, Juergen Rieck, and Alan Zheng "Wafer-level micro-optics: trends in manufacturing, testing, packaging, and applications", Proc. SPIE 8557, Optical Design and Testing V, 855702 (26 November 2012)
5. Andreas Georgiou, Jacob Hadnett-Hunter, Charlie Hewitt, Mario Possiwan, Brian Guenter, Maria Pace, Ishan Chatterjee, Joel Kollin, and Bernard Kress "A hybrid head mounted display with small total track length and large field of view", Proc. SPIE 12624, Digital Optical Technologies 2023, 1262406 (7 August 2023)
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3