A Brief Overview of SiC MOSFET Failure Modes and Design Reliability
Author:
Publisher
Elsevier BV
Subject
General Medicine
Reference18 articles.
1. Yuan Zhang, Yung C. Liang, 2014. Over-Current Protection Scheme for SiC Power MOSFET DC Circuit Breaker, IEEE.
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3. Santini, T., Sebastien, M., Florent, M., Phung, L., and Allard, B., 2013. Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications, 2013 IEEE ECCE Asia Downunder - 5th IEEE Annual International Energy Conversion Congress and Exhibition, IEEE ECCE Asia 2013 2013, pp. 385-391.
4. Dasgupta, S., Kaplar, R.J., Marinella, M.J., Smith, M.A. and Atcitty, S., 2012. Analysis and prediction of stability in commercial, 1200 V, 33A, 4H-SiC MOSFETs, IEEE International Reliability Physics Symposium Proceedings 2012, pp. 3D.3.1-3D.3.5.
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