Root Cause Analysis of Product Service Failure Using Computer Experimentation Technique-Reference-Cited by-同舟云学术

Root Cause Analysis of Product Service Failure Using Computer Experimentation Technique

Published:2013 Issue: Volume:11 Page:44-49
ISSN:2212-8271
Container-title:Procedia CIRP
language:en
Short-container-title:Procedia CIRP

Author:

Shrouti Chetan,Franciosa Pasquale,Ceglarek Darek

Publisher

Elsevier BV

Subject

General Medicine

Reference9 articles.

1. Collaborative Approach to Warranty Cost Reduction;Barkai;Manufacturing Insites,2006

2. Functional Capability Space and Optimum Process Adjustments for Manufacturing Processes with In-Specs Failures;Mannar;IIE Transactions,2010

3. Multivariate statistical methods for modeling and analysis of wafer probe test data;Skinner;IEEE Transaction on SemiconductorManufacturing,2002

4. Fault Region Localization (FRL): Product and Process Improvement Based on Field Performance and Distributed Manufacturing Measurements;Mannar;IEEE Trans. on Automation Science and Engineering,2006

5. Functional Process Adjustments to Reduce No-Fault-Found Product Failures in Service Caused by In-tolerance Faults;Prakash;Annals of CIRP,2009

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