On X-ray diffraction study of preferred grain orientations in polycrystalline thin films — Multicomponent texture in KTaO3 films-Reference-Cited by-同舟云学术

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On X-ray diffraction study of preferred grain orientations in polycrystalline thin films — Multicomponent texture in KTaO3 films

Published:2013-03 Issue: Volume:530 Page:2-8
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Kužel R.,Buršík J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. The Materials Science of Thin Films;Ohring,1992

2. Thin Film Materials, Stress, Defect Formation and Surface Evolution;Freund,2003

3. Thin Film Analysis by X-ray Scattering;Birkholz,2006

4. Combined Analysis;Chateigner,2010

5. Orientations and Rotations;Morawiec,2004

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1. INFLUENCE OF Cu CONTENT ON PREFERRED ORIENTATION AND PROPERTIES OF CrCuN COATINGS;Surface Review and Letters;2019-07-02

2. Effect of Ni Content on Double-Target Co-sputtered CrNiN Coatings;Journal of Materials Engineering and Performance;2019-04-16

3. Nonlinear optical imaging of defects in cubic silicon carbide epilayers;Scientific Reports;2014-06-11

4. Atomic layer deposition of sodium and potassium oxides: evaluation of precursors and deposition of thin films;Dalton Trans.;2014

5. Role of reaction atmosphere in preparation of potassium tantalate through sol–gel method;Journal of Sol-Gel Science and Technology;2013-09-19

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