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Cu-accumulation at the interface between sputter-(Zn,Mg)O and Cu(In,Ga)(S,Se)2 — A key to understanding the need for buffer layers?

  • Published:2007-05 Issue:15 Volume:515 Page:6015-6019
  • ISSN:0040-6090
  • Container-title:Thin Solid Films
  • language:en
  • Short-container-title:Thin Solid Films

Author:

Lauermann I.,Loreck Ch.,Grimm A.,Klenk R.,Mönig H.,Lux-Steiner M.Ch.,Fischer Ch.-H.,Visbeck S.,Niesen T.P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. SHORT COMMUNICATION: ACCELERATED PUBLICATION: Diode characteristics in state-of-the-art ZnO/CdS/Cu(In1?xGax)Se2 solar cells

2. Bulk and interface properties of (Zn,Mg)O buffer layers sputtered in hydrogen-containing atmosphere

3. Proc. of Thin-film Compound Semiconductor Photovoltaics: Symposium held March 29–April 1. 2005, MRS Spring Meeeting;Lauermann,2005

4. Practical Surface Analysis;Briggs,1990

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