Author:
Manivannan Venkatesan,Enzenroth Robert A.,Barth Kurt L.,Kohli Sandeep,McCurdy Patrick R.,Sampath Walajabad S.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. K.L. Barth, R.A. Enzenroth, W.S. Sampath, US Patent No. 6, 423, 565, 23 July 2002.
2. 29th IEEE Photovoltaic Specialists Conference, New Orleans, Louisiana, U.S.A., May 20 – 24;Barth,2002
3. Measurement of cooling rates of a superstrate cooling apparatus for an integrated in-line manufacturing process for thin-film photovoltaic devices
4. Thin Film Partnership Program, Final Report, NREL, CO;Sampath,2004
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