Determination of three-dimensional interfacial strain — A novel method of probing interface structure with X-ray Bragg-surface diffraction-Reference-Cited by-同舟云学术

Determination of three-dimensional interfacial strain — A novel method of probing interface structure with X-ray Bragg-surface diffraction

Published:2007-05 Issue:14 Volume:515 Page:5716-5723
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Sun W.-C.,Chu C.-H.,Chang H.-C.,Wu B.-K.,Chen Y.-R.,Cheng C.-W.,Chiu M.-S.,Shen Y.-C.,Wu H.-H.,Hung Y.-S.,Chang S.-L.,Hong M.-H.,Tang M.-T.,Stetsko Yu.P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering

2. Grazing incidence small angle x-ray scattering from free-standing nanostructures

3. Small-angle x-ray scattering under grazing incidence: The cross section in the distorted-wave Born approximation

4. X-ray-scattering studies of the interfacial structure of Au/GaAs

5. X-ray scattering studies on InGaAs quantum dots

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